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SUMMARY:Seminar: Manufacturing Test for Microelectronic Devices: Balancing
  Yield\, Quality and Reliability
DTSTART;TZID=Europe/Rome;VALUE=DATE-TIME:20151216T110000
DTEND;TZID=Europe/Rome;VALUE=DATE-TIME:20151216T130000
DTSTAMP;VALUE=DATE-TIME:20260408T195031Z
UID:7cf78b61bd864c45b680705d59bd40bc@dei.unibo.it
CREATED;VALUE=DATE-TIME:20130219T090847Z
DESCRIPTION:The seminar will be given by Dr. Juergen Alt\, Intel Corporati
 on\, Germany\, as part of the course "Sistemi Elettronici ad Alta Affidabi
 lità M".
LAST-MODIFIED;VALUE=DATE-TIME:20151215T103823Z
URL:https://dei.unibo.it/en/events/seminario-manufacturing-test-for-microe
 lectronic-devices-balancing-yield-quality-and-reliability
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TZID:Europe/Rome
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BEGIN:STANDARD
DTSTART;VALUE=DATE-TIME:20151025T020000
TZNAME:CET
TZOFFSETFROM:+0200
TZOFFSETTO:+0100
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