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SUMMARY:Seminar: Scan Compression Techniques to Improve Test Time and Qual
 ity
DTSTART;TZID=Europe/Rome;VALUE=DATE-TIME:20170503T140000
DTEND;TZID=Europe/Rome;VALUE=DATE-TIME:20170504T110000
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UID:9bc80999ccca46c48f04be8b9e49a588@dei.unibo.it
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DESCRIPTION:The seminar will be given by Dr. Juergen Alt\, Intel Corporati
 on\, as part of the course "Trends in Electronics M."
LAST-MODIFIED;VALUE=DATE-TIME:20170502T153702Z
URL:https://dei.unibo.it/en/events/seminario-scan-compression-techniques-t
 o-improve-test-time-and-quality-2017
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