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SUMMARY:Seminar: Scan Compression Techniques to Improve Test Time and Qual
 ity
DTSTART;TZID=Europe/Rome;VALUE=DATE-TIME:20160516T090000
DTEND;TZID=Europe/Rome;VALUE=DATE-TIME:20160517T120000
DTSTAMP;VALUE=DATE-TIME:20260417T071951Z
UID:9953e83b674d4e20a3698036ac1e08d3@dei.unibo.it
CREATED;VALUE=DATE-TIME:20130219T090847Z
DESCRIPTION:The seminar will be given by Dr. Juergen Alt\, Intel Corporati
 on\, as part of the courses "Trends in Electronics M" and "Design for Test
 ability and Reliability of Integrated Circuits M."
LAST-MODIFIED;VALUE=DATE-TIME:20160513T123847Z
URL:https://dei.unibo.it/en/events/seminario-scan-compression-techniques-t
 o-improve-test-time-and-quality
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DTSTART;VALUE=DATE-TIME:20160327T030000
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