BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Plone.org//NONSGML plone.app.event//EN
X-WR-TIMEZONE:Europe/Rome
BEGIN:VEVENT
SUMMARY:Seminar: Testing of Automotive IC's: Introduction and Advances
DTSTART;VALUE=DATE:20171030
DTEND;VALUE=DATE:20171031
DTSTAMP;VALUE=DATE-TIME:20260409T123636Z
UID:7c94fe50802045eb8f85f6271428251a@dei.unibo.it
CREATED;VALUE=DATE-TIME:20130219T090847Z
DESCRIPTION:The seminar will be given by Davide Appello\, Product Engineer
 ing Director\, STMicroelectronics Automotive Digital Products Division\, a
 s part of the course "Test\, Diagnosis and Reliability M."
LAST-MODIFIED;VALUE=DATE-TIME:20211229T110323Z
URL:https://dei.unibo.it/en/events/seminario-testing-of-automotive-ics
END:VEVENT
END:VCALENDAR