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BEGIN:VEVENT
SUMMARY:High-Voltage GaN Power Devices with Highest Quality and Highest Re
 liability
DTSTART;TZID=Europe/Rome;VALUE=DATE-TIME:20200515T160000
DTEND;TZID=Europe/Rome;VALUE=DATE-TIME:20200515T180000
DTSTAMP;VALUE=DATE-TIME:20260521T001020Z
UID:c82a8b9894c34edaaeb1cd292207b390@dei.unibo.it
CREATED;VALUE=DATE-TIME:20200505T122019Z
DESCRIPTION:Un seminario del Dr. Davide Bisi\, Transphorm Inc.
LAST-MODIFIED;VALUE=DATE-TIME:20200513T101513Z
URL:https://dei.unibo.it/it/eventi/fundamentals-of-functional-safety-and-p
 erspectives
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DTSTART;VALUE=DATE-TIME:20200329T030000
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