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BEGIN:VEVENT
SUMMARY:Seminario: Manufacturing Test for Microelectronic Devices: Balanci
 ng Yield\, Quality and Reliability
DTSTART;TZID=Europe/Rome;VALUE=DATE-TIME:20151216T110000
DTEND;TZID=Europe/Rome;VALUE=DATE-TIME:20151216T130000
DTSTAMP;VALUE=DATE-TIME:20260415T094306Z
UID:a163fb5d15294e9eb44406bfa3cf0e1a@dei.unibo.it
CREATED;VALUE=DATE-TIME:20130219T090847Z
DESCRIPTION:Il seminario sarà tenuto dal Dr. Juergen Alt\, Intel Corporat
 ion\, Germany\, nell'ambito del corso "Sistemi Elettronici ad Alta Affidab
 ilità M".
LAST-MODIFIED;VALUE=DATE-TIME:20151215T103714Z
URL:https://dei.unibo.it/it/eventi/seminario-manufacturing-test-for-microe
 lectronic-devices-balancing-yield-quality-and-reliability
END:VEVENT
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TZID:Europe/Rome
X-LIC-LOCATION:Europe/Rome
BEGIN:STANDARD
DTSTART;VALUE=DATE-TIME:20151025T020000
TZNAME:CET
TZOFFSETFROM:+0200
TZOFFSETTO:+0100
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