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BEGIN:VEVENT
SUMMARY:Seminario: Scan Compression Techniques to Improve Test Time and Qu
 ality
DTSTART;TZID=Europe/Rome;VALUE=DATE-TIME:20170503T140000
DTEND;TZID=Europe/Rome;VALUE=DATE-TIME:20170504T110000
DTSTAMP;VALUE=DATE-TIME:20260506T002409Z
UID:713c2b46a9b74af8805caf1935939579@dei.unibo.it
CREATED;VALUE=DATE-TIME:20130219T090847Z
DESCRIPTION:Il seminario sarà tenuto dal Dr. Juergen Alt\, Intel Corporat
 ion\, nell'ambito del corso "Trends in Electronics M" della Laurea Magistr
 ale in Ingegneria Elettronica\, curriculum Electronics and Communication S
 cience and Technology (ECST).
LAST-MODIFIED;VALUE=DATE-TIME:20170502T101148Z
URL:https://dei.unibo.it/it/eventi/seminario-scan-compression-techniques-t
 o-improve-test-time-and-quality-2017
END:VEVENT
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TZID:Europe/Rome
X-LIC-LOCATION:Europe/Rome
BEGIN:DAYLIGHT
DTSTART;VALUE=DATE-TIME:20170326T030000
TZNAME:CEST
TZOFFSETFROM:+0100
TZOFFSETTO:+0200
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