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BEGIN:VEVENT
SUMMARY:Seminario: Scan Compression Techniques to Improve Test Time and Qu
 ality
DTSTART;TZID=Europe/Rome;VALUE=DATE-TIME:20160516T090000
DTEND;TZID=Europe/Rome;VALUE=DATE-TIME:20160517T120000
DTSTAMP;VALUE=DATE-TIME:20260505T131742Z
UID:5fd24b2f54be4edeb74f7c68b1e46e4e@dei.unibo.it
CREATED;VALUE=DATE-TIME:20130219T090847Z
DESCRIPTION:Il seminario sarà tenuto dal Dr. Juergen Alt\, Intel Corporat
 ion\, nell'ambito dei corsi "Trends in Electronics M" e "Design for Testab
 ility and Reliability of Integrated Circuits M".
LAST-MODIFIED;VALUE=DATE-TIME:20160513T123610Z
URL:https://dei.unibo.it/it/eventi/seminario-scan-compression-techniques-t
 o-improve-test-time-and-quality
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TZID:Europe/Rome
X-LIC-LOCATION:Europe/Rome
BEGIN:DAYLIGHT
DTSTART;VALUE=DATE-TIME:20160327T030000
TZNAME:CEST
TZOFFSETFROM:+0100
TZOFFSETTO:+0200
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