BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Plone.org//NONSGML plone.app.event//EN
X-WR-TIMEZONE:Europe/Rome
BEGIN:VEVENT
SUMMARY:Seminario: Testing of Automotive IC's: Introduction and Advances
DTSTART;VALUE=DATE:20171030
DTEND;VALUE=DATE:20171031
DTSTAMP;VALUE=DATE-TIME:20260521T001021Z
UID:64719263f16a4632831ab3827cfb3680@dei.unibo.it
CREATED;VALUE=DATE-TIME:20130219T090847Z
DESCRIPTION:Il seminario sarà tenuto da Davide Appello\, Product Engineer
 ing Director\, STMicroelectronics Automotive Digital Products Division\, n
 ell'ambito del corso "Test\, Diagnosis and Reliability M".
LAST-MODIFIED;VALUE=DATE-TIME:20211229T113820Z
URL:https://dei.unibo.it/it/eventi/seminario-testing-of-automotive-ics
END:VEVENT
END:VCALENDAR