Chiplets and 3D-ICs: Challenges and Opportunities of Silicon Lifecycle Management

The seminar will be given by Yervant Zorian, Chief Architect & Fellow, Synopsys Inc., as part of the course "Test, Diagnosis and Reliability M."

  • Date: 03 December 2024 from 16:00 to 17:00

  • Event location: Room 2.2, viale Risorgimento 2, Bologna

  • Access Details: Free admission

About the speaker

Dr. Yervent Zorian is a Chief Architect and Fellow at Synopsys, as well as President of Synopsys Armenia. Formerly, he was Vice President and Chief Scientist of Virage Logic, Chief Technologist at LogicVision, and a Distinguished Member of Technical Staff AT&T Bell Laboratories. He is currently the President of IEEE Test Technology Technical Council (TTTC), the founder and chair of the IEEE 1500 Standardization Working Group, and an Adjunct Professor at University of British Columbia. He served on the Board of Governors of Computer Society and CEDA, was the Vice President of IEEE Computer Society, and the General Chair of the 50th Design Automation Conference (DAC), 50th International Test Conference (ITC) and several other symposia and workshops. Dr. Zorian holds 45 US patents, has authored five books, published over 450 refereed papers and received numerous best paper awards. A Fellow of the IEEE since 1999, Dr. Zorian was the 2005 recipient of the prestigious Industrial Pioneer Award for his contribution to BIST, and the 2006 recipient of the IEEE Hans Karlsson Award for diplomacy. He received the IEEE Distinguished Services Award for leading the TTTC, the IEEE Meritorious Award for outstanding contributions to EDA, and in 2014, the Republic of Armenia's National Medal of Science, and in 2022, the IEEE TTTC Lifetime Contribution Medal. He received an MS degree in Computer Engineering from University of Southern California, a PhD in Electrical Engineering from McGill University, and an MBA from Wharton School of Business, University of Pennsylvania.

Abstract

With increasing system complexity and stringent runtime requirements for AI accelerators, high-performance computing and autonomous vehicles, reliable, safe and secure operation of electronic systems are still a major challenge, particularly, with the increased use of third party chiplets and multi-die systems. This talk will focus on optimizing silicon health by using advanced solutions throughout the silicon life cycle stages, from chiplet design, to bring up, volume production, tmid-stack, 3D packaging and in-field operation. The advanced solutions for silicon lifecycle management (SLM) to be discussed will starts by embedding a range of monitoring engines in different levels of the design, access mechanisms and solutions for on-chip and across the chips network, as well as data analytics on the edge and in the cloud for fleet optimization.