Seminar: Nonlinear Measurements for RF Power Amplifier Characterization and Modeling using a Keysight PNA-X

The seminar will be given by Dr. Francesco Tafuri, Aalborg University and Keysight Technologies, Denmark, as part of the course "Elettronica delle Telecomunicazioni M".

  • Date: 21 December 2016 from 00:00 to 14:30

  • Event location: Aula Magna, School of Engineering and Architecture, viale Risorgimento 2, Bologna

Contact Name:

Contact Phone: + 39 051 2093039

About the speaker

Felice Francesco Tafuri received the B.Sc. in 2007 and the M.Sc. in 2010 in Electronics Engineering, both cum laude, from the Polytechnic of Bari, Italy. In 2014 he obtained the Ph.D. degree in the Wireless Communication program at Aalborg University, Denmark with a dissertation on linearity and efficiency enhancement of mobile communication power amplifiers. In 2013 he was the recipient of the European Microwave Conference Young Engineer Prize. Since 2014 he is with Keysight Technologies Denmark, where he is involved in an industrial postdoctoral project on advanced high efficiency transmitter characterization and modeling in partnership with Aalborg University and the Danish High Technology Foundation (HTF). His research interests include nonlinear measurement techniques, behavioral modeling and linearization of RF power amplifiers, digital predistortion architectures and their hardware implementation, efficiency enhancement techniques for RF power amplifiers and advanced envelope tracking transmitter architectures.

Abstract

This workshop is focused on the characterization and modeling of radio-frequency power amplifiers by means of nonlinear microwave measurement techniques. Aspects of research and methods carried out by the EDM-LAB group are introduced, while Keysight Technologies (ex Agilent) will present trends and challenges of 5G applications, including its own ongoing industrial research. In particular, the PNA-X general purpose measurement platform by Keysight is shown in a demo. This set-up is used to demonstrate some of the most recently developed PNA-X nonlinear measurement capabilities, including RF PA long-term memory effects characterization, model extraction, and interaction with simulations.