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Department of Electrical, Electronic, and Information Engineering "Guglielmo Marconi" - DEI

Seminar: Manufacturing Test for Microelectronic Devices: Balancing Yield, Quality and Reliability

The seminar will be given by Dr. Juergen Alt, Intel Corporation, Germany, as part of the course "Sistemi Elettronici ad Alta Affidabilità M".

  • Date: 16 December 2015 from 11:00 to 13:00

  • Event location: Room 2.7a, School of Engineering and Architecture, viale Risorgimento 2, Bologna

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About the speaker

Juergen Alt is with Intel Corporation based in Munich, Germany. He is responsible for Design-for-Test Methodology for Intel’s mobile business. Juergen is working in Design & Test, EDA-Software and Reliability since more than 20 years. In 1995 he received a PhD from University of Hannover, Germany and started his industrial career the same year with Siemens Semiconductors (later Infineon).

 

Abstract

This presentation guides you intro semiconductors - building blocks for all kinds of electronic equipment. Semiconductor industry has to master 2x complexity increase within a 2 years period. This increase is driven by Moore’s Law since 1965. Quality and Reliability are key challenges especially for most advanced technology nodes. Manufacturing test of semiconductor devices has to guarantee outgoing quality and balance it with business constraints like product’s yield. An industrial view on today’s problems and solution combined with an outlook to the future is given with this talk.