Tutte le pubblicazioni
Tutte le pubblicazioni prodotte da docenti e ricercatori del DEI dal 2004 ad oggi
-
Dell'Amico M.; Martello S.; Vigo D., Minimizing the sum of weighted completion times with unrestricted weights, «DISCRETE APPLIED MATHEMATICS», 1995, 63, pp. 25 - 41 [Articolo in rivista]
-
Filicori F.; Vannini G.; Santarelli A.; Sanchez A.M.; Tazon A.; Newport Y., Empirical Modeling of Low-Frequency Dispersive Effects Due to Traps and Thermal Phenomena in III-V FET' s, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 1995, 43, pp. 2972 - 2981 [Articolo in rivista]
-
Filicori F.; Vannini G.; Santarelli A.; Torcolacci D.; Monaco V.A., Accurate prediction of intermodulation distortion in GaAs MESFETs, in: 1995 25th European Microwave Conference, Institute of Electrical and Electronics Engineers Inc., 1995, 2, pp. 625 - 629 (atti di: 25th European Microwave Conference, EuMC 1995, ita, 1995) [Contributo in Atti di convegno]
-
Filicori F.; Vannini G.; Santarelli A.; Mediavilla A.; Tazon A.; Newport Y., Empirical modeling of low-frequency dispersive effects due to traps and thermal phenomena in III-V FETs, in: IEEE MTT-S International Microwave Symposium Digest, Piscataway, NJ, United States, IEEE, «IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST», 1995, 3, pp. 1557 - 1560 (atti di: Proceedings of the 1995 IEEE MTT-S International Microwave Symposium. Part 1 (of 3), Orlando, FL, USA,, 1995) [Contributo in Atti di convegno]
-
Montanari G.C.; Mazzanti G.; Cacciari M.; Fothergill J.C., Unbiasing procedures for the Weibull distribution? Be careful!, in: Proceedings of 5th IEEE International Conference on Conduction and Breakdown in Solid Dielectrics (IEEE ICSD), Piscataway, New Jersey, IEEE, 1995, pp. 175 - 179 (atti di: 5th IEEE International Conference on Conduction and Breakdown in Solid Dielectrics (IEEE ICSD), Leicester (Regno Unito), 10-13 luglio 1995) [Contributo in Atti di convegno]
-
Mazzanti G.; Montanari G.C.; Motori A.; Anelli P., Comparison of electrical aging tests on EPR-insulated minicables and ribbons from full-sized EPR cable, «IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION», 1995, 2, pp. 1095 - 1099 [Articolo in rivista]
-
Dissado L.; Mazzanti G.; Montanari G.C., Incorporation of space charge degradation in the life model for electrical insulating materials, «IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION», 1995, 2, pp. 1147 - 1158 [Articolo in rivista]
-
Mazzanti G.; Montanari G.C.; Simoni L.; Srinivas M.B., Combined electro-thermo-mechanical model for life prediction of electrical insulating materials, in: Proceedings of 1995 IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP), Piscataway, New Jersey, IEEE, 1995, pp. 274 - 277 (atti di: 1995 IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP), Virginia Beach (Virginia, U.S.A.), ottobre 1995) [Contributo in Atti di convegno]
-
Pierrat L.; Montanari G.C.; Mazzanti G.; Cacciari M., Weibull Statistics in Short-term Dielectric Breakdown of Thin Polyethylene Films, «IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION», 1995, 2, pp. 321 - 326 [Replica/breve intervento (e simili)]