Tutte le pubblicazioni

L. Chiari, Stabilometry, in: Encyclopedia of Neuroscience, BERLIN HEIDELBERG, Springer, 2008, pp. 3830 - 3833 [Voce in dizionario o enciclopedia]

L. Chiari; E. Farella; L. Rocchi; L. Benini, A biofeedback-based portable device to support elderly mobility in the home environment, in: null, «GERONTECHNOLOGY», 2008, 7(2), pp. 93 - 93 (atti di: 6th International Conference on Gerontechnology, Pisa, June 4-6, 2008) [Riassunto (Abstract)]

L. Sandrolini; U. Reggiani, Investigation on the Shielding Effectiveness Properties of Electrically Conductive Textiles, in: Proc. 2008 Asia Pacific Microwave Conference (APMC), PISCATAWAY, NEW JERSEY, IEEE, 2008, pp. 1 - 4 (atti di: 2008 Asia Pacific Microwave Conference (APMC), Hong Kong and Macau, China, Dec. 16-20, 2008) [Contributo in Atti di convegno]

U. Reggiani; L. Sandrolini, Interferenze elettromagnetiche nei sistemi di potenza del materiale rotabile, in: Atti della XXIV Riunione Annuale dei Ricercatori di Elettrotecnica - ET2008, PAVIA, Università degli Studi di Pavia, 2008, pp. 1 - 2 (atti di: XXIV Riunione Annuale dei Ricercatori di Elettrotecnica - ET2008, Pavia, Italia, 19 - 21 giugno 2008) [Riassunto (Abstract)]

L. Sandrolini; U. Reggiani, Accoppiamenti elettromagnetici multimodali in contenitori metallici in presenza di piani conduttori, in: PROF. P. DI BARBA, Atti della XXIV Riunione Annuale dei Ricercatori di Elettrotecnica - ET2008, PAVIA, Università degli Studi di Pavia, 2008, pp. 1 - 2 (atti di: XXIV Riunione Annuale dei Ricercatori di Elettrotecnica - ET2008, Pavia, Italia, 19 - 21 giugno 2008) [Riassunto (Abstract)]

G.C. Montanari; A. Cavallini; L. Testa; S. Serra; L.A. Dissado, Model of ageing inception and growth from microvoids in polyethylene-based materials under AC voltage, in: Conference records of the2008 IEEE Conference Electrical Insulation and Dielectric Properties, PISCATAWAY, IEEE, 2008, pp. 29 - 32 (atti di: 2008 IEEE Conference Electrical Insulation and Dielectric Properties, Quebec City, Canada, Ottobre 2008) [Contributo in Atti di convegno]

M. Tozzi; G.L. Giuliattini Burbui; A. Cavallini; G.C. Montanari, Coupling mechanisms for PD in MV cables, in: Conference records of the 2008 IEEE Conference Electrical Insulation and Dielectric Properties, PISCATAWAY, IEEE, 2008, pp. 413 - 416 (atti di: 2008 IEEE Conference Electrical Insulation and Dielectric Properties, Quebec city, Canada, Ottobre 2008) [Contributo in Atti di convegno]

A. Cavallini; G.C. Montanari; R. Candela; L. Testa, Partial discharge detection in medium voltage sustems using directional antenna sensors, in: Conference records of the 2008 IEEE Conference Electrical Insulation and Dielectric Properties, PISCATAWAY, IEEE, 2008, pp. 455 - 458 (atti di: 2008 IEEE Conference Electrical Insulation and Dielectric Properties, Quebec city, Canada, Ottobre 2008) [Contributo in Atti di convegno]

D. Fabiani; G.C. Montanari; C. Laurent; G. Teyssedre; P.H.F. Morshuis; R. Bodega; L. Dissado, HVDC Cable Design and Space Charge Accumulation. Part 3: Effect of Temperature Gradient., «IEEE ELECTRICAL INSULATION MAGAZINE», 2008, 24, pp. 5 - 14 [Articolo in rivista]

D. Fabiani; G. C. Montanari; L. Testa; R. Schifani; F. Guastavino; F. Bellucci; F. Deorsola, Effect of Water Adsorption on the Dielectric Properties of Polymer Nanocomposites, in: Proceedings of IEEE ISEIM, PISCATAWAY, IEEE, 2008, pp. 510 - 513 (atti di: IEEE International Symposium on Electrical Insulating Materials (ISEIM), Yokkaichi, Japan, Settembre 2008) [Contributo in Atti di convegno]

D. Fabiani; A. Cavallini; G.C. Montanari, A UHF technique for advanced PD measurements on inverter-fed motors, «IEEE TRANSACTIONS ON POWER ELECTRONICS», 2008, 23, pp. 2546 - 2556 [Articolo in rivista]

A. Cavallini; D. Fabiani; G. C. Montanari, A Novel Method to Diagnose PWM-fed Induction Motors, «IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION», 2008, 15, pp. 1313 - 1321 [Articolo in rivista]

S. Delpino; D. Fabiani; G.C. Montanari, High space charge dynamic in EVA-based nano composite flat specimens, in: Proceedings of IEEE CEIDP, PISCATAWAY, IEEE, 2008, pp. 137 - 140 (atti di: IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Quebec, Canada, Ottobre 2008) [Contributo in Atti di convegno]

D. Fabiani; G.C. Montanari; A. Dardano; G. Guastavino; L. Testa; M. Sangermano, Space charge dynamics in nanostructured epoxy resin, in: Proceedings of IEEE CEIDP, PISCATAWAY, IEEE, 2008, pp. 710 - 713 (atti di: IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Quebec, Canada, Ottobre 2008) [Contributo in Atti di convegno]

A. Raffo; V. Vadalà; P. A. Traverso; A. Santarelli; G. Vannini; F. Filicori, An Innovative Two-Source Large-Signal Measurement System for the Characterization of Low-Frequency Dispersive Effects in FETs, in: IMEKO - INTERNATIONAL MEASUREMENT CONFEDERATION, Proceedings of the 16th IMEKO TC4 Symposium, FIRENZE, s.n, 2008, pp. 72 - 77 (atti di: 16th IMEKO TC4 Symposium, Firenze, September 22-24, 2008) [Contributo in Atti di convegno]

P.A. Traverso; G. Pasini; A. Raffo; D. Mirri, The DTCM characterization approach for the qualification of dynamic non-linearities within A/D channels, in: IMEKO - INTERNATIONAL MEASUREMENT CONFEDERATION, Proceedings of the 16th IMEKO TC4 Symposium: 13th IMEKO TC4 Workshop on ADC Modelling and Testing, FIRENZE, s.n, 2008, pp. 1139 - 1144 (atti di: 16th IMEKO TC4 Symposium: 13th IMEKO TC4 Workshop on ADC Modelling and Testing, Firenze, September 22-24, 2008) [Contributo in Atti di convegno]

C. Metra; M. Omaña; T.M. Mak; A. Rahman; S. Tam, Novel On-Chip Clock Jitter Measurement Scheme For High Performance Microprocessors, in: Proceedings of The 23rd IEEE International on Defect and Fault Tolerance in VLSI Systems, LOS ALAMITOS, D, Gizopoulos, M. Tehranipoor, 2008, pp. 465 - 473 (atti di: The 23rd IEEE International on Defect and Fault Tolerance in VLSI Systems, Cambridge (MA), USA, 1-3 Ottobre 2008) [Contributo in Atti di convegno]

X. Ma; J. Huang; F. Chiminazzo; D. Rossi; C. Metra; F. Lombardi, Resistive Crossbar Switching Networks to Implement Inherently Fault Tolerant Nano LUTs, in: Proceedings of 2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems, LOS ALAMITOS, C. Metra, A. DeHon, 2008, pp. 21 - 24 (atti di: 2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems, Cambridge (MA), USA, 29-30 Settembre 2008) [Contributo in Atti di convegno]

G. Baccarani; F. Lombardi; A. DeHon; C. Metra, Welcome Message from the Chairs, in: Proceedings of the 1st IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems, LOS ALAMITOS, G. Baccarani, F. Lombardi, A. DeHon, C. Metra, 2008, pp. viii - viii [Breve introduzione]

A. Orailoglu; P. Maxwell; C. Metra, Proceedings of IEEE 26th VLSI Test Symposium, LOS ALAMITOS, IEEE, 2008, pp. 438 . [Curatela]