Contatto di riferimento: Prof. Alberto Santarelli
Recapito telefonico per contatti: + 39 051 2093039
About the speaker
Born in Cosenza (Italy) in 1982, received the Bachelor and Master degrees in Electronic Engineering from the University of Calabria in 2004 e 2006. In 2006 he was visiting scholar at IMEC (Leuven, Belgium) in the context of Erasmus program. In 2008 he joined the TELEMIC division of the Electrical Department (ESAT) of KU Leuven, Belgium. He received the PhD from KU Leuven in 2012. Since 2012 he is a post-doctoral researcher supported by Fonds Wetenschappelijk Onderzoek (FWO) Vlaanderen. In 2013 and 2014 was a visiting researcher at National Institute of Standards and Technology (NIST) in Boulder, Colorado. His research focuses on characterization and modeling of microwave solid-state devices.
Abstract
The seminar will deal with vector-calibrated measurement systems used for characterization of solid-state devices at microwave frequencies. In particular, the seminar will focus on Large-Signal Network Analyzers (LSNAs). LSNAs working principle will be described along with a calibration procedure. Also, measurement uncertainty of these systems will be partially mentioned. Next, some aspects of nonlinear modeling of transistors for microwave applications will be treated. Finally, a model extraction procedure, combined with LSNA measurements, will be discussed.