Tutte le pubblicazioni
Tutte le pubblicazioni prodotte da docenti e ricercatori del DEI dal 2004 ad oggi
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Lodi A.; Martello S.; Vigo D., Heuristic algorithms for the three-dimensional bin packing problem, «EUROPEAN JOURNAL OF OPERATIONAL RESEARCH», 2002, 141, pp. 410 - 420 [Articolo in rivista]
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Santarelli A.; Zucchelli G.; Paganelli R.; Vannini G.; Filicori F., Equivalent-voltage approach for modeling low-frequency dispersive effects in microwave FETs, «IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS», 2002, 12, pp. 339 - 341 [Articolo in rivista]
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Costantini A.; Paolo R.P.; Traverso P.A.; Argento D.; Favre G.; Pagani M.; Santarelli A.; Vannini G.; Filicori F., Accurate prediction of PHEMT intermodulation distortion using the nonlinear discrete convolution model, in: IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278), 345 E 47TH ST, NEW YORK, NY 10017 USA, IEEE, «IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST», 2002, 2, pp. 857 - 860 (atti di: IEEE MTT-S International Microwave Symposium, Seattle, WA, USA, 2-7 June 2002) [Contributo in Atti di convegno]
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Paganelli R.; Santarelli A.; Zucchelli G.; Costantini A.; Vannini G.; Filicori F., A computationally efficient approach for the design of RF power amplifiers, in: 2002 32nd European Microwave Conference, EuMC 2002, IEEE Computer Society, 2002, pp. 1 - 4 (atti di: 2002 32nd European Microwave Conference, EuMC 2002, Milan, ita, 2002) [Contributo in Atti di convegno]
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Cidronali A.; Collodi G.; Santarelli A.; Vannini G.; Manes G., Millimeter-wave FET modeling using on-wafer measurements and EM simulation, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2002, 50, pp. 425 - 432 [Articolo in rivista]
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Montanari G.C.; Mazzanti G.; Simoni L., Progress in electrothermal life modeling of electrical insulation during the last decades, «IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION», 2002, 9, pp. 730 - 745 [Articolo in rivista]
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Mazzanti G.; Montanari C.; Dissado L.A., Erratum: Elemental strain and trapped space charge in thermoelectric ageing of insulating materials life modeling (IEEE Transactions on Dielectrics and Electrical Insulation (2001) 8 (966-971), «IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION», 2002, 9, pp. 481 - 481 [Articolo in rivista]
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Montanari G.C.; Mazzanti G., Ageing of polymeric insulating materials and insulation system design, «POLYMER INTERNATIONAL», 2002, 51, pp. 1151 - 1158 [Articolo in rivista]
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Cavallini A.; Fabiani D.; Mazzanti G.; Montanari G.C., Life model based on space-charge quantities for HVDC polymeric cables subjected to voltage-polarity inversions, «IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION», 2002, 9, pp. 514 - 523 [Articolo in rivista]
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Cacciari M.; Mazzanti G.; Montanari G.C.; Jacquelin J., A robust technique for the estimation of the two-parameter Weibull function for complete data sets, «METRON», 2002, 60, pp. 65 - 92 [Articolo in rivista]
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Alison J.M.; Mazzanti G.; Montanari G.C.; Palmieri F., Mobility estimation in polymeric insulation through space charge profiles derived by PEA measurements, in: Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP), Piscataway, New Jersey, IEEE, 2002, pp. 35 - 39 (atti di: IEEE Conference on Electrical Insulation and Dielectric Phenomena (IEEE CEIDP), Cancun, Messico, ottobre 2002) [Contributo in Atti di convegno]
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Caprara A.; Lodi A.; Monaci M., An approximation scheme for the two-stage, two-dimensional bin packing problem, «MATHEMATICS OF OPERATIONS RESEARCH», 2002, 2337, pp. 315 - 328 [Articolo in rivista]
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Lodi A.; Martello S.; Monaci M., Two-dimensional packing problems: A survey, «EUROPEAN JOURNAL OF OPERATIONAL RESEARCH», 2002, 141, pp. 241 - 252 [Articolo in rivista]
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E. Ficarra; L. Benini; B. Ricco; G. Zuccheri, Automated DNA sizing in atomic force microscope images, in: Proceedings IEEE International Symposium on Biomedical Imaging, Washington, IEEE, 2002, pp. 453 - 456 [Capitolo/Saggio in libro]
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C. Guiducci; C. Stagni; G. Zuccheri; A. Bogliolo; L. Benini; B. Samorì; B. Riccò, A biosensor for direct detection of DNA sequences based on capacitance measurements, in: Proceedings of the 32nd European Solid-State Device Research Conference, Firenze, IEEE, 2002, pp. 479 - 482 [Capitolo/Saggio in libro]
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Barbiroli M.; Carciofi C.; Falciasecca G.; Frullone M.; Grazioso P.; Varini A., A new statistical approach for urban environment propagation modeling, «IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY», 2002, 51, pp. 1234 - 1240 [Articolo in rivista]
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Montanari G.C.; Fabiani D.; Melloni M.; Palmieri F., Diagnostic markers for ac power cable insulation aging based on space charge measurements, in: Conference Record of IEEE International Symposium on Electrical Insulation, 2002, pp. 464 - 467 (atti di: 2002 IEEE International Symposium on Electrical Insulation, Boston, MA, usa, 2002) [Contributo in Atti di convegno]
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Reggiani S.; Valdinoci A.; Colalongo L.; Rudan M.; Baccarani G.; Stricker A.; Illien F.; Felber N.; Fichtner W.; Mettler S.; Lindenkreuz S.; Zullino L., Surface mobility in silicon at large operating temperature, in: International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, Institute of Electrical and Electronics Engineers Inc., 2002, 2002-, pp. 15 - 20 (atti di: International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2002, International Conference Center Kobe, jpn, 2002) [Contributo in Atti di convegno]
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Gnani E.; Reggiani S.; Rudan M.; Baccarani G., Extraction method for the impact-ionization multiplication factor in silicon at large operating temperatures, in: European Solid-State Device Research Conference, IEEE Computer Society, «PROCEEDINGS OF THE EUROPEAN SOLID STATE DEVICE RESEARCH CONFERENCE», 2002, pp. 227 - 230 (atti di: 32nd European Solid-State Device Research Conference, ESSDERC 2002, ita, 2002) [Contributo in Atti di convegno]
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Reggiani S.; Bertoni A.; Rudan M., Numerical simulation of a two-particle wave function in quantum wires, in: International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, Institute of Electrical and Electronics Engineers Inc., 2002, 2002-, pp. 175 - 178 (atti di: International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2002, International Conference Center Kobe, jpn, 2002) [Contributo in Atti di convegno]