Seminario: Testing of Automotive IC's: Introduction and Advances

Il seminario sarà tenuto da Davide Appello, Product Engineering Director, STMicroelectronics Automotive Digital Products Division, nell'ambito del corso "Test, Diagnosis and Reliability M".

  • Data: 30 ottobre 2017

  • Luogo: Aula 5.2, Scuola di Ingegneria e Architettura, viale Risorgimento 2, Bologna

Contatto di riferimento:

About the speaker

Davide Appello holds a degree in Electronics Engineering from the University of Pavia. He is with STMicroelectronics since 1994 where his main occupation are on testability and testing. He is currently product engineering director for the automotive digital products division. Davide authored and co-authored 60+ papers published at conferences and on journals. He is active within TTTC and TTEP groups of IEEE.


Electronics content in the car is constantly growing. On top of traditional applications for engine control, transmission, braking/steering, passive safety, body and dashboard also multimedia, advanced driver assistance and car2X segments are rapidly growing. The stability and extended duration in manufacturing of these components makes them very attractive for the industry. Extreme product quality achieved with very low cost is the key challenge. The proposed invited talk covers a broad range of topics which are defining the testability, testing and manufacturing requirements of automotive products. Advanced topics like testing of safety critical and secure devices are proposed beside more traditional topics like testability, test development, qualification, industrialization, burn-in and manufacturing. Relevant industrial cases will be proposed to participants.